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"An enhanced fault model for high defect coverage."
Junzhi Sang et al. (2001)
- Junzhi Sang, Tsuyoshi Shinogi, Haruhiko Takase, Hidehiko Kita, Terumine Hayashi:
An enhanced fault model for high defect coverage. Syst. Comput. Jpn. 32(6): 36-44 (2001)
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