"Metric information mining with metric attention to boost software defect ..."

Yongchang Ding et al. (2026)

> Home

Details and statistics

DOI: 10.1016/J.SCICO.2025.103381

access: open

type: Journal Article

metadata version: 2025-11-02

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/scp/DingHLCCPJ26
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/scp/DingHLCCPJ26
Yongchang Ding, Wei Han, Zhiqiang Li, Haowen Chen, Linjun Chen, Rong Peng, Xiao-Yuan Jing:
Metric information mining with metric attention to boost software defect prediction performance. Sci. Comput. Program. 248: 103381 (2026)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.