"A New Stitching Method for Dark-Field Surface Defects Inspection Based on ..."

Xue Chen, Jiaqi Li, Yongxin Sui (2020)

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DOI: 10.3390/S20020448

access: open

type: Journal Article

metadata version: 2020-05-30

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Xue Chen, Jiaqi Li, Yongxin Sui:
A New Stitching Method for Dark-Field Surface Defects Inspection Based on Simplified Target-Tracking and Path Correction. Sensors 20(2): 448 (2020)

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