"Electrical Characterization of the Backside Interface on BSI Global ..."

Célestin Doyen et al. (2020)

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DOI: 10.3390/S20010287

access: open

type: Journal Article

metadata version: 2020-06-16

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  - https://dblp.org/rec/journals/sensors/DoyenRMMBP20
Célestin Doyen, Stéphane Ricq, Pierre Magnan, Olivier Marcelot, Marios Barlas, Sébastien Place:
Electrical Characterization of the Backside Interface on BSI Global Shutter Pixels with Tungsten-Shield Test Structures on CDTI Process. Sensors 20(1): 287 (2020)

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