"Durability Assessment of Bonded Piezoelectric Wafer Active Sensors for ..."

Jesús N. Eiras, Ludovic Gavérina, Jean-Michel Roche (2024)

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DOI: 10.3390/S24020450

access: open

type: Journal Article

metadata version: 2024-03-16

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Jesús N. Eiras, Ludovic Gavérina, Jean-Michel Roche:
Durability Assessment of Bonded Piezoelectric Wafer Active Sensors for Aircraft Health Monitoring Applications. Sensors 24(2): 450 (2024)

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