"Layer Contour Verification in Additive Manufacturing by Means of ..."

David Blanco Fernandez et al. (2020)

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DOI: 10.3390/S20010001

access: open

type: Journal Article

metadata version: 2025-11-09

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  - https://dblp.org/rec/journals/sensors/FernandezFNAV20
David Blanco Fernandez, Pedro Fernández, Alvaro Noriega, Braulio Jose Alvarez, Gonzalo Valiño:
Layer Contour Verification in Additive Manufacturing by Means of Commercial Flatbed Scanners. Sensors 20(1): 1 (2020)

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