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"On-Machine LTS Integration for Layer-Wise Surface Quality Characterization ..."
Alejandro Fernández et al. (2024)
- Alejandro Fernández

, Pablo Zapico
, David Blanco
, Fernando Peña
, Natalia Beltrán
, Sabino Mateos Diaz
:
On-Machine LTS Integration for Layer-Wise Surface Quality Characterization in MEX/P. Sensors 24(11): 3459 (2024)

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