"A Data-Driven Long Time-Series Electrical Line Trip Fault Prediction ..."

Li Guo, Runze Li, Bin Jiang (2021)

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DOI: 10.3390/S21134466

access: open

type: Journal Article

metadata version: 2025-08-27

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Li Guo, Runze Li, Bin Jiang:
A Data-Driven Long Time-Series Electrical Line Trip Fault Prediction Method Using an Improved Stacked-Informer Network. Sensors 21(13): 4466 (2021)

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