"Bypassing Heaven's Gate Technique Using Black-Box Testing."

SeonJin Hwang et al. (2023)

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DOI: 10.3390/S23239417

access: open

type: Journal Article

metadata version: 2024-02-29

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SeonJin Hwang, Assem Utaliyeva, Jae-Seok Kim, Yoon-Ho Choi:
Bypassing Heaven's Gate Technique Using Black-Box Testing. Sensors 23(23): 9417 (2023)

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