"A Multi-Layered 3D NDT Scan-Matching Method for Robust Localization in ..."

Taeho Kim, Haneul Jeon, Donghun Lee (2023)

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DOI: 10.3390/S23052671

access: open

type: Journal Article

metadata version: 2023-03-28

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Taeho Kim, Haneul Jeon, Donghun Lee:
A Multi-Layered 3D NDT Scan-Matching Method for Robust Localization in Logistics Warehouse Environments. Sensors 23(5): 2671 (2023)

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