"Two-Stream Network One-Class Classification Model for Defect Inspections."

Seunghun Lee et al. (2023)

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DOI: 10.3390/S23125768

access: open

type: Journal Article

metadata version: 2023-07-13

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Seunghun Lee, Chenglong Luo, Sungkwan Lee, Hoeryong Jung:
Two-Stream Network One-Class Classification Model for Defect Inspections. Sensors 23(12): 5768 (2023)

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