"Remaining Useful Life Estimation of Insulated Gate Biploar Transistors ..."

Zhen Liu et al. (2017)

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DOI: 10.3390/S17112524

access: open

type: Journal Article

metadata version: 2018-11-14

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  - https://dblp.org/rec/journals/sensors/LiuMZYZ17
Zhen Liu, Wenjuan Mei, Xianping Zeng, Chenglin Yang, Xiuyun Zhou:
Remaining Useful Life Estimation of Insulated Gate Biploar Transistors (IGBTs) Based on a Novel Volterra k-Nearest Neighbor Optimally Pruned Extreme Learning Machine (VKOPP) Model Using Degradation Data. Sensors 17(11): 2524 (2017)

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