"A Novel Inspection Technique for Electronic Components Using Thermography ..."

Haochen Liu et al. (2020)

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DOI: 10.3390/S20175013

access: open

type: Journal Article

metadata version: 2023-10-05

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Haochen Liu, Lawrence Tinsley, Wayne Lam, Sri Addepalli, Xiaochen Liu, Andrew Starr, Yifan Zhao:
A Novel Inspection Technique for Electronic Components Using Thermography (NITECT). Sensors 20(17): 5013 (2020)

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