"Two-Scale Simulation of Drop-Induced Failure of Polysilicon MEMS Sensors."

Stefano Mariani et al. (2011)

Details and statistics

DOI: 10.3390/S110504972

access: open

type: Journal Article

metadata version: 2019-10-19

a service of  Schloss Dagstuhl - Leibniz Center for Informatics