"Bistable Boron-Related Defect Associated with the Acceptor Removal Process ..."

Andrei Nitescu et al. (2023)

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DOI: 10.3390/S23125725

access: open

type: Journal Article

metadata version: 2023-07-13

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Andrei Nitescu, Cristina Besleaga, George Alexandru Nemnes, Ioana Pintilie:
Bistable Boron-Related Defect Associated with the Acceptor Removal Process in Irradiated p-Type Silicon - Electronic Properties of Configurational Transformations. Sensors 23(12): 5725 (2023)

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