"Industrial Product Surface Anomaly Detection with Realistic Synthetic ..."

Tao Peng et al. (2024)

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DOI: 10.3390/S24010264

access: open

type: Journal Article

metadata version: 2024-01-16

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Tao Peng, Yu Zheng, Lin Zhao, Enrang Zheng:
Industrial Product Surface Anomaly Detection with Realistic Synthetic Anomalies Based on Defect Map Prediction. Sensors 24(1): 264 (2024)

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