"Leakage Current Non-Uniformity and Random Telegraph Signals in CMOS Image ..."

Alexandre Le Roch et al. (2019)

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DOI: 10.3390/S19245550

access: open

type: Journal Article

metadata version: 2020-06-16

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Alexandre Le Roch, Vincent Goiffon, Olivier Marcelot, Philippe Paillet, Federico Pace, Jean-Marc Belloir, Pierre Magnan, Cédric Virmontois:
Leakage Current Non-Uniformity and Random Telegraph Signals in CMOS Image Sensor Floating Diffusions Used for In-Pixel Charge Storage. Sensors 19(24): 5550 (2019)

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