"Logistic Regression for Machine Learning in Process Tomography."

Tomasz Rymarczyk et al. (2019)

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DOI: 10.3390/S19153400

access: open

type: Journal Article

metadata version: 2024-07-04

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Tomasz Rymarczyk, Edward Kozlowski, Grzegorz Klosowski, Konrad Niderla:
Logistic Regression for Machine Learning in Process Tomography. Sensors 19(15): 3400 (2019)

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