"A Spectroscopic Reflectance-Based Low-Cost Thickness Measurement System ..."

Néstor Eduardo Sánchez-Arriaga et al. (2023)

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DOI: 10.3390/S23115326

access: open

type: Journal Article

metadata version: 2024-10-06

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Néstor Eduardo Sánchez-Arriaga, Divya Tiwari, Windo Hutabarat, Adrian Leyland, Ashutosh Tiwari:
A Spectroscopic Reflectance-Based Low-Cost Thickness Measurement System for Thin Films: Development and Testing. Sensors 23(11): 5326 (2023)

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