"An Infrared Defect Sizing Method Based on Enhanced Phase Images."

Yanjie Wei et al. (2020)

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DOI: 10.3390/S20133626

access: open

type: Journal Article

metadata version: 2020-08-13

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Yanjie Wei, Zhilong Su, Shuangshuang Mao, Dongsheng Zhang:
An Infrared Defect Sizing Method Based on Enhanced Phase Images. Sensors 20(13): 3626 (2020)

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