"Ultrahigh Resolution Thickness Measurement Technique Based on a Hollow ..."

Zheyu Wu et al. (2020)

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DOI: 10.3390/S20072035

access: open

type: Journal Article

metadata version: 2023-09-27

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Zheyu Wu, Bin Liu, Jiangfeng Zhu, Juan Liu, Shengpeng Wan, Tao Wu, Jinghua Sun:
Ultrahigh Resolution Thickness Measurement Technique Based on a Hollow Core Optical Fiber Structure. Sensors 20(7): 2035 (2020)

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