"A Non-Intrusive Method for Monitoring the Degradation of MOSFETs."

Lifeng Wu et al. (2014)

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DOI: 10.3390/S140101132

access: open

type: Journal Article

metadata version: 2018-11-14

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Lifeng Wu, Yu Zheng, Yong Guan, Guohui Wang, Xiaojuan Li:
A Non-Intrusive Method for Monitoring the Degradation of MOSFETs. Sensors 14(1): 1132-1139 (2014)

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