"A Novel Out-of-Control Action Plan (OCAP) for Optimizing Efficiency and ..."

Woonyoung Yeo et al. (2024)

> Home

Details and statistics

DOI: 10.3390/S24165116

access: open

type: Journal Article

metadata version: 2024-10-03

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/sensors/YeoCCC24
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/sensors/YeoCCC24
Woonyoung Yeo, Yung-Chia Chang, Liang-Ching Chen, Kuei-Hu Chang:
A Novel Out-of-Control Action Plan (OCAP) for Optimizing Efficiency and Quality in the Wafer Probing Process for Semiconductor Manufacturing. Sensors 24(16): 5116 (2024)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.