"Automotive 2.1 μm Full-Depth Deep Trench Isolation CMOS Image Sensor ..."

Dongsuk Yoo et al. (2023)

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DOI: 10.3390/S23229150

access: open

type: Journal Article

metadata version: 2025-11-15

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Dongsuk Yoo, Youngtae Jang, Youngchan Kim, Jihun Shin, Kangsun Lee, Seok-Yong Park, Seungho Shin, Hongsuk Lee, Seojoo Kim, Joongseok Park, Cheonho Park, Moosup Lim, Hyungjin Bae, Soeun Park, Minwook Jung, Sungkwan Kim, Shinyeol Choi, Sejun Kim, Jin-kyeong Heo, Hojoon Lee, Kyungchoon Lee, Youngkyun Jeong, Youngsun Oh, Min-Sun Keel, Bumsuk Kim, Haechang Lee, JungChak Ahn:
Automotive 2.1 μm Full-Depth Deep Trench Isolation CMOS Image Sensor with a 120 dB Single-Exposure Dynamic Range. Sensors 23(22): 9150 (2023)

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