Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Interface Profile Near the Contact Line in Electro-Wetting on Dielectric."

Hanwen Cui, Weiqing Ren (2020)

> Home

Details and statistics

DOI: 10.1137/19M1254374

access: closed

type: Journal Article

metadata version: 2020-05-20

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/siamam/CuiR20
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/siamam/CuiR20
Hanwen Cui, Weiqing Ren:
Interface Profile Near the Contact Line in Electro-Wetting on Dielectric. SIAM J. Appl. Math. 80(1): 402-421 (2020)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.