"Source Consistency Electrical Impedance Tomography."

Tingting Zhang et al. (2020)

> Home

Details and statistics

DOI: 10.1137/18M1225264

access: closed

type: Journal Article

metadata version: 2023-09-30

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/siamam/ZhangJOJWW20
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/siamam/ZhangJOJWW20
Tingting Zhang, Geuk Young Jang, Tong In Oh, Kyung Woon Jeung, Hun Wi, Eung Je Woo:
Source Consistency Electrical Impedance Tomography. SIAM J. Appl. Math. 80(1): 499-520 (2020)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.