"VAIF: Variance-driven Automated Instrumentation Framework."

Mert Toslali et al. (2022)

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DOI: 10.1145/3544497.3544504

access: closed

type: Journal Article

metadata version: 2023-09-30

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  - https://dblp.org/rec/journals/sigops/ToslaliAHZLPCS22
Mert Toslali, Emre Ates, Darby Huye, Zhaoqi Zhang, Lan Liu, Samantha Puterman, Ayse K. Coskun, Raja R. Sambasivan:
VAIF: Variance-driven Automated Instrumentation Framework. ACM SIGOPS Oper. Syst. Rev. 56(1): 42-50 (2022)

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