"Patent data analysis using functional count data model."

Jong-Min Kim et al. (2019)

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DOI: 10.1007/S00500-018-3481-6

access: closed

type: Journal Article

metadata version: 2025-01-19

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Jong-Min Kim, Nak-Kyeong Kim, Yoon-Sung Jung, Sunghae Jun:
Patent data analysis using functional count data model. Soft Comput. 23(18): 8815-8826 (2019)

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