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"Software defect prediction: do different classifiers find the same defects?"

David Bowes, Tracy Hall, Jean Petric (2018)

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DOI: 10.1007/S11219-016-9353-3

access: open

type: Journal Article

metadata version: 2020-06-08

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  - journals/sqj/BowesHP18
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David Bowes, Tracy Hall, Jean Petric:
Software defect prediction: do different classifiers find the same defects? Softw. Qual. J. 26(2): 525-552 (2018)

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