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"Costs and benefits of early defect detection: experiences from developing ..."

Rudolf van Megen, Dirk Meyerhoff (1995)

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DOI: 10.1007/BF00402646

access: closed

type: Journal Article

metadata version: 2023-08-28

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Rudolf van Megen, Dirk Meyerhoff:
Costs and benefits of early defect detection: experiences from developing client server and host applications. Softw. Qual. J. 4(4): 247-256 (1995)

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