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"Automatic CoDec generation to reduce test engineering cost."

Ariel Sabiguero, Anthony Baire, César Viho (2008)

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DOI: 10.1007/S10009-008-0073-2

access: closed

type: Journal Article

metadata version: 2020-04-02

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  - https://dblp.org/rec/journals/sttt/SabigueroBV08
Ariel Sabiguero, Anthony Baire, César Viho:
Automatic CoDec generation to reduce test engineering cost. Int. J. Softw. Tools Technol. Transf. 10(4): 337-346 (2008)

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