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"DEMINER: test generation for high test coverage through mutant exploration."

Yunho Kim, Shin Hong (2021)

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DOI: 10.1002/STVR.1715

access: closed

type: Journal Article

metadata version: 2021-02-11

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Yunho Kim, Shin Hong:
DEMINER: test generation for high test coverage through mutant exploration. Softw. Test. Verification Reliab. 31(1-2) (2021)

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