"t-SNVAE: Deep Probabilistic Learning With Local and Global Structures for ..."

Jian Huang et al. (2025)

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DOI: 10.1109/TAI.2025.3533438

access: closed

type: Journal Article

metadata version: 2025-07-06

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Jian Huang, Zizhuo Liu, Xu Yang, Yupeng Liu, Zhaomin Lv, Kaixiang Peng, Okan K. Ersoy:
t-SNVAE: Deep Probabilistic Learning With Local and Global Structures for Industrial Process Monitoring. IEEE Trans. Artif. Intell. 6(6): 1603-1613 (2025)

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