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"Similarity Searching for Defective Wafer Bin Maps in Semiconductor ..."

Chung-Shou Liao et al. (2014)

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DOI: 10.1109/TASE.2013.2277603

access: closed

type: Journal Article

metadata version: 2022-10-04

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  - journals/tase/LiaoHHC14
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  - https://dblp.org/rec/journals/tase/LiaoHHC14
Chung-Shou Liao, Tsung-Jung Hsieh, Yu-Syuan Huang, Chen-Fu Chien:
Similarity Searching for Defective Wafer Bin Maps in Semiconductor Manufacturing. IEEE Trans Autom. Sci. Eng. 11(3): 953-960 (2014)

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