"Peak Force Torsional Resonance Microscopy for Accurate Nanoscale ..."

Jialin Shi et al. (2025)

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DOI: 10.1109/TASE.2025.3555896

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type: Journal Article

metadata version: 2025-05-09

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Jialin Shi, Huiyao Shi, Yongliang Yang, Peng Yu, Tie Yang, Yang Yang, Chanmin Su, Lianqing Liu:
Peak Force Torsional Resonance Microscopy for Accurate Nanoscale Characterization of In-Plane and Out-of-Plane Mechanical Properties. IEEE Trans Autom. Sci. Eng. 22: 13684-13693 (2025)

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