"A Low-Cost Burn-In Tester Architecture to Supply Effective Electrical Stress."

Francesco Angione et al. (2023)

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DOI: 10.1109/TC.2022.3199994

access: open

type: Journal Article

metadata version: 2025-11-02

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Francesco Angione, Davide Appello, Paolo Bernardi, Claudia Bertani, Giovambattista Gallo, Stefano Littardi, Giorgio Pollaccia, Walter Ruggeri, Matteo Sonza Reorda, Vincenzo Tancorre, Roberto Ugioli:
A Low-Cost Burn-In Tester Architecture to Supply Effective Electrical Stress. IEEE Trans. Computers 72(5): 1447-1459 (2023)

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