"The Weighted Syndrome Sums Approach to VLSI Testing."

Zeev Barzilai et al. (1981)

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DOI: 10.1109/TC.1981.1675744

access: closed

type: Journal Article

metadata version: 2017-05-20

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  - https://dblp.org/rec/journals/tc/BarzilaiSMS81
Zeev Barzilai, Jacob Savir, George Markowsky, Merlin G. Smith:
The Weighted Syndrome Sums Approach to VLSI Testing. IEEE Trans. Computers 30(12): 996-1000 (1981)

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