"Test Generation for Path Delay Faults Using Binary Decision Diagrams."

Debashis Bhattacharya, Prathima Agrawal, Vishwani D. Agrawal (1995)

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DOI: 10.1109/12.372035

access: closed

type: Journal Article

metadata version: 2017-05-20

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  - https://dblp.org/rec/journals/tc/BhattacharyaAA95
Debashis Bhattacharya, Prathima Agrawal, Vishwani D. Agrawal:
Test Generation for Path Delay Faults Using Binary Decision Diagrams. IEEE Trans. Computers 44(3): 434-447 (1995)

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