"Test Data Compression and Test Resource Partitioning for System-on-a-Chip ..."

Anshuman Chandra, Krishnendu Chakrabarty (2003)

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DOI: 10.1109/TC.2003.1223641

access: closed

type: Journal Article

metadata version: 2022-01-03

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Anshuman Chandra, Krishnendu Chakrabarty:
Test Data Compression and Test Resource Partitioning for System-on-a-Chip Using Frequency-Directed Run-Length (FDR) Codes. IEEE Trans. Computers 52(8): 1076-1088 (2003)

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