"Test Generation with Dynamic Probe Points in High Observability Testing ..."

Oliver Chiu-sing Choy et al. (1996)

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DOI: 10.1109/12.481489

access: closed

type: Journal Article

metadata version: 2022-04-04

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Oliver Chiu-sing Choy, Lap-kong Chan, Ray Chan, Cheong-Fat Chan:
Test Generation with Dynamic Probe Points in High Observability Testing Environment. IEEE Trans. Computers 45(1): 88-96 (1996)

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