"Random Pattern Testing Versus Deterministic Testing of RAM's."

René David, Antoine Fuentes, Bernard Courtois (1989)

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DOI: 10.1109/12.24267

access: closed

type: Journal Article

metadata version: 2017-05-20

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René David, Antoine Fuentes, Bernard Courtois:
Random Pattern Testing Versus Deterministic Testing of RAM's. IEEE Trans. Computers 38(5): 637-650 (1989)

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