"Physical Versus Logical Fault Models MOS LSI Circuits: Impact on Their ..."

J. Galiay, Yves Crouzet, M. Vergniault (1980)

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DOI: 10.1109/TC.1980.1675614

access: closed

type: Journal Article

metadata version: 2017-05-20

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J. Galiay, Yves Crouzet, M. Vergniault:
Physical Versus Logical Fault Models MOS LSI Circuits: Impact on Their Testability. IEEE Trans. Computers 29(6): 527-531 (1980)

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