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"Fast Static Compaction Algorithms for Sequential Circuit Test Vectors."

Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. Patel (1999)

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DOI: 10.1109/12.754997

access: closed

type: Journal Article

metadata version: 2017-05-20

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  dblp key:
  - journals/tc/HsiaoRP99
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  persistent URL:
  - https://dblp.org/rec/journals/tc/HsiaoRP99
Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. Patel:
Fast Static Compaction Algorithms for Sequential Circuit Test Vectors. IEEE Trans. Computers 48(3): 311-322 (1999)

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