"Parallel Testing for Pattern-Sensitive Faults in Semiconductor ..."

Pinaki Mazumder, Janak H. Patel (1989)

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DOI: 10.1109/12.21126

access: closed

type: Journal Article

metadata version: 2017-05-20

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Pinaki Mazumder, Janak H. Patel:
Parallel Testing for Pattern-Sensitive Faults in Semiconductor Random-Access Memories. IEEE Trans. Computers 38(3): 394-407 (1989)

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