"A Novel Approach to Random Pattern Testing of Sequential Circuits."

Lama Nachman et al. (1998)

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DOI: 10.1109/12.656097

access: closed

type: Journal Article

metadata version: 2017-05-20

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  persistent URL:
  - https://dblp.org/rec/journals/tc/NachmanSUR98
Lama Nachman, Kewal K. Saluja, Shambhu J. Upadhyaya, Robert Reuse:
A Novel Approach to Random Pattern Testing of Sequential Circuits. IEEE Trans. Computers 47(1): 129-134 (1998)

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