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"Test-Pattern Generation Based on Reed-Muller Coefficients."

Name: dblp XML data dump
Creator: Schloss Dagstuhl - Leibniz Center for Informatics
Published: 1993
License: https://creativecommons.org/publicdomain/zero/1.0/
Keywords: dblp, XML, computer science, scholarly publications, metadata

Julio Ortega Lopera et al. (1993)

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DOI: 10.1109/12.238487

access: closed

type: Journal Article

metadata version: 2020-06-10

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  dblp key:
  - journals/tc/OrtegaRPP93
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  persistent URL:
  - https://dblp.org/rec/journals/tc/OrtegaRPP93
Julio Ortega Lopera, Antonio Lloris-Ruíz, Alberto Prieto, Francisco J. Pelayo:
Test-Pattern Generation Based on Reed-Muller Coefficients. IEEE Trans. Computers 42(8): 968-980 (1993)

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