"The Influence of Masking Phenomenon on Coverage Capability of Single Fault ..."

Janusz Rajski, Jerzy Tyszer (1986)

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DOI: 10.1109/TC.1986.1676665

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type: Journal Article

metadata version: 2025-05-01

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Janusz Rajski, Jerzy Tyszer:
The Influence of Masking Phenomenon on Coverage Capability of Single Fault Test Sets in PLA's. IEEE Trans. Computers 35(1): 81-85 (1986)

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