"A Comprehensive Test Pattern Generation Approach Exploiting the SAT Attack ..."

Yadi Zhong, Ujjwal Guin (2023)

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DOI: 10.1109/TC.2023.3248268

access: closed

type: Journal Article

metadata version: 2023-08-05

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Yadi Zhong, Ujjwal Guin:
A Comprehensive Test Pattern Generation Approach Exploiting the SAT Attack for Logic Locking. IEEE Trans. Computers 72(8): 2293-2305 (2023)

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