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"Worst case tolerance analysis and CLP-based multifrequency test generation ..."

Abdessatar Abderrahman, Eduard Cerny, Bozena Kaminska (1999)

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DOI: 10.1109/43.748163

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - journals/tcad/AbderrahmanCK99
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  - https://dblp.org/rec/journals/tcad/AbderrahmanCK99
Abdessatar Abderrahman, Eduard Cerny, Bozena Kaminska:
Worst case tolerance analysis and CLP-based multifrequency test generation for analog circuits. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 18(3): 332-345 (1999)

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