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"Identifying Wafer-Level Systematic Failure Patterns via Unsupervised Learning."

Mohamed Baker Alawieh, Fa Wang, Xin Li (2018)

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DOI: 10.1109/TCAD.2017.2729469

access: closed

type: Journal Article

metadata version: 2020-09-24

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  - journals/tcad/AlawiehWL18
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  - https://dblp.org/rec/journals/tcad/AlawiehWL18
Mohamed Baker Alawieh, Fa Wang, Xin Li:
Identifying Wafer-Level Systematic Failure Patterns via Unsupervised Learning. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 37(4): 832-844 (2018)

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